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IR Inspection System       Polished Wafer   Model: STIE600 Application: Solar Square Multicrystal Silicon Ingot Production Quality Control           Step and Scan Platform 700     Model:SSP 700 Application: A versatile platform to probe semiconductor/solar bulk, film materials and devices.

About Us | IR Inspection System | Step & Scan Platform | Silicon Wafer | Crucible | Semiconductor Parts | Sputtering Targets & Evaporation Materials | Contact Us Copyright © 2009 Transmill Technologies Inc. All rights reserved